The radar target simulator "R&S RTS" for automotive radar and in particular its ability to electronically simulate very close-range objects, has been used to verify the performance of NXP Semiconductors’ next-generation radar sensor reference design. This collaboration enables the automotive industry to take...
Electric vehicles contain many electronic components that emit radio-frequency interference which may have a negative impact on the vehicle performance and driving experience. To ease and speed up the development process, AVL and Rohde & Schwarz, two of the world’s leading providers of automotive test systems,...
Rohde & Schwarz now offers a test solution for full RF performance characterization of the DUT on-wafer which combines the powerful R&S ZNA vector network analyzer from Rohde & Schwarz with industry-leading engineering probe systems from Form-Factor. As a result, semiconductor manufacturers can perform...
